CVE-2018-13888

There is potential for memory corruption in the RIL daemon due to de reference of memory outside the allocated array length in RIL in Snapdragon Auto…

published February 11, 2019

CVSS
—
EPSS
0%
Percentile
13.3
In the wild
Unconfirmed
What it is

There is potential for memory corruption in the RIL daemon due to de reference of memory outside the allocated array length in RIL in Snapdragon Auto, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables in versions MDM9206, MDM9607, MDM9635M, MDM9650, MSM8909W, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 439 / SD 429, SD 450, SD 625, SD 636, SD 650/52, SD 675, SD 712 / SD 710 / SD 670, SD 820A, SD 835, SD 845 / SD 850, SD 855, SDM439, SDM630, SDM660, ZZ_QCS605.

The record
Technical detail
CVSS
Not scored
CVSS v4.0
Not supplied
EPSS
0.00232 · 13.3th percentile
Published
2019-02-11T15:00Z
EPSS history
Timeline
  • 11 FEB 15:00Z
    There is potential for memory corruption in the RIL daemon due to de reference of memory outside the allocated array length in RIL in Snapdragon Auto…
    cvelistv5